Trace Analysis

In research and development of the new advanced materials in which demand for higher purity and better functionality is increased it is important to determine the amount of trace elements added to major elements and to detect and quantify impurity elements if present.

In an early stage of research and development of the new advanced materials and manufacture of its prototype the sample quantity for analysis is often very limited.

JEF-TEC can respond to the client's needs in trace analysis by selecting the optimum sampling method and the optimum analysis method based on the predicted concentration of unknown elements and impurities allowing the trace analysis of the sample at minimum quantity with high accuracy and precision.

Analysis of Steel-Related Materials and Non-Ferrous Metals

Analysis of Steel-Related Materials and Non-Ferrous Metals

High research activity to increase the purity of the steel-related materials and non-ferrous metals results in better understanding of the effects of trace elements in these materials and the way to control impurities for improving the performance and the functionality of products based on these materials. Importance of the trace analysis of elements and impurities with high accuracy and precision as well as high sensitivity is well recognized.

In trace analysis of the metal materials JEF-TEC uses a combination of the optimum sample preparation method in accordance with the sample composition with the optimum analytical method in accordance with the concentration of elements to be analyzed, thereby allowing the quantification of trace metal components, volatile components, and halogens.

Analysis Examples

  • Analysis of Ultra-trace Amount of Residual Hydrogen
  • Laser Ablation Inductively Coupled Plasma Mass Spectromethy(LA-ICP-MS)
  • Ultra-Trace Analysis of Highly Pure Metals and Electronics Materials

Analysis of Advanced Materials (Analysis of Materials for Functional Products)

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In research and development of the materials for functional products such as battery materials, semiconductor materials, magnets, target bodies, and thermoelectric materials it is important to identify the trace element species and to quantify their concentration.

JEF-TEC provides the analysis service of the atmospheric moisture and/or air-sensitive samples which are handled and analyzed in the cryogenic and humidity chamber or in a glove box filled with inert gas and the ultra-trace analysis of elements in the clean room for preventing the sample from contaminating with the analysis environment. Use of proper facilities ensures the accurate, reproducible analysis of these samples.

Analysis Examples

Chemical Analysis of Medical Devices and Medical Related Products

Chemical Analysis of Medical Devices and Medical Related Products

JEF-TEC can perform the elution test of materials used in medical devices and in implants for judging the biocompatibility of the materials, the analysis of impurities in medicinal drugs, and the trace analysis of impurities in chemical products and raw materials for them.

Please don't hesitate to contact us for the elution test to comply with the standards of JIS, ISO, and EN.

Evaluation of Medical Equipment/Implant Materials

Selection of an Analysis Method and a Flow of the Analysis Procedure

Confirmation of specimen receipt JEF-TEC will inform the client to confirm sample receipt and propose the appropriate analysis method to the client.

Ultra-trace analysis

JEF-TEC firstly prepares the specimen for the trance analysis in a clean room for preventing the sample from contamination from the environment. The sample is always handled in the clean room from weighing to analysis, ensuring accurate, reproducible analysis of trace components.

Analysis method Qualitative analysis (ICP mass spectrometry)
Quantitative analysis (ICP mass spectrometry, electrothermal atomic absorption spectrometry)
High resolution ICP mass spectrometer
High resolution ICP mass spectrometer

Analysis of trace sulfur and halogens

JEF-TEC can provide the analysis service on sulfur and halogens in trace quantities and at high concentration.

Elements to be analyzed Sulfur (S) and halogens (F, Cl, Br, and I)
Automated combustion ion chromatography apparatus
Automated combustion ion chromatography apparatus

Trace analysis

In accordance with the sample composition and measurement components the accurate analysis can be insured by selecting a measurement method to avoid the spectrum interference in certain elements such as rare earth metals and to increase the analysis sensitivity.

Analysis method Qualitative analysis (ICP mass spectrometry)
Quantitative analysis
(ICP mass spectrometry, atomic absorption spectrometry, wet chemical analysis)

ICP optical emission spectrometer
ICP atomic emission spectrometer

Flame atomic absorption spectrometer
Flame atomic absorption spectrometer

Specimen Type for Analysis and Detection Limit

Specimen type for analysis and its shape

  • Battery materials (cathode, anode, electrolytes)
  • Alloys and sintered compact
  • Rare earth magnets
  • Carbon materials (graphite, carbon nanotube (CNT)), etc.

Specimen in a form of bulks, powders, and films can be analyzed by JEF-TEC.

Detection limit in trace analysis

Metal elements 1 ppm (ICP mass spectrometry)
Sulfur (S) and halogens 5 - 10 ppm (combustion ion chromatography)

* The detection limit may be varied with the amount of specimen and the elements to be analyzed.

In the samples with no knowledge of its composition and analysis of impurities the qualitative analysis may be firstly performed, followed by the quantitative analysis of the components detected.

Analysis Example of Lithium-Ion Secondary Battery

Chemical analysis of samples in trace quantities

A few tens of mg of the specimen is sufficient for the composition analysis and impurities analysis in trace quantities.

Purpose Analysis compositions Analysis method
Composition analysis Bismuth (Bi), tellurium (Te) ICP atomic emission spectroscopy
Qualitative analysis Impurity components ICP mass spectrometry

Analysis Example of Thermoelectric Element

High precision analysis of a small amount (5 mg) of specimen

A small amount of major components (Ni, Mn, Co, and Li) in the ternary cathode materials is quantified by the ICP optical emission spectroscopy and their results are shown below.

wt%
Element Content ± σ
Lithium (Li) 6.82 ±0.16
Manganese (Mn) 16.7 ±0.4
Cobalt (Co) 18.8 ±0.4
Nickel (Ni) 17.6 ±0.4

Analysis of lithium in the anode when varying the charging rate

Disassembling of the batteries without exposing to the atmosphere is combined with the trace analysis technique to quantify lithium varied with the charging rate as well as to determine the irreversible capacity loss after cyclic charging.

Lithium atom per C6 unit

Analysis Example of Rare Earth Magnet

Thermal demagnetization in inert atmosphere

The specimen is thermally demagnetized under the nitrogen atmosphere. Don't hesitate to contact us if you have any problem with thermal demagnetization of the samples.

Thermal demagnetization in inert atmosphere

ICP atomic emission spectroscopy of rare earth metal components

In the analysis of rare earth metals such as neodymium (Nd) and dysprosium (Ds) interference spectrum are likely to affect the accuracy of analysis, but JEF-TEC has expertise and experience to eliminate the spectral interference.

Purpose Analysis compositions Analysis method
Composition analysis Neodymium (Nd), Dysprosium (Dy),
Iron (Fe),
Boron (B)
ICP atomic emission spectroscopy
Qualitative analysis Impurity components ICP mass spectrometry

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