Elementary analysis

Analysis of element of minute parts

By using microbeam analysis, JFE-TEC undertakes elementary analysis of minute parts.

  • By means of an electron probe micro-analyzer (EPMA) and energy dispersive X-ray analysis by scanning electron microscopy (SEM-EDX), it is possible to conduct qualitative analysis and quantitative analysis mapping of minute parts of several μm or less in size.
  • By means of field emission-electron probe micro-analyzer (FE-EPMA), it is possible to conduct quantitative analysis of minute parts 100 nm in size. By means of energy dispersive X-ray analysis by ultra-low voltage scanning electron microscopy (ULV-SEM-EDX), it is possible to conduct 30-nm order analysis.
  • By means of energy dispersive X-ray analysis (EDX) and electron energy loss spectroscopy (EELS) equipped on transmission electron microscopy (TEM), it is possible to conduct qualitative analysis and quantitative analysis mapping of minute parts several nm or less in size.
  • Using transmission electron microscopy with Cs corrector (Cs corrector STEM), ultra-fine atomic scale analysis in 0.1-nm order is possible.
  • Using electron energy loss spectroscopy (EELS), it is possible to analyze the chemical bonding state of elements. State analysis using plasma oscillation and interband transition is also possible.

Electron probe micro-analyzer (EPMA), energy dispersive X-ray analysis (EDX)

Available analysis method Feature Case example
  • Electron probe micro-analyzer (EPMA)
  • By EPMA and SEM-EDX, analysis of minute part in μm level is possible.
  • By FE-EPMA, 100-nm high-resolution qualitative analysis, quantitative analysis, and mapping are possible.
  • By ULV-SEM-EDX, 30-nm high-resolution qualitative analysis, quantitative analysis, and mapping are possible.

Analysis of surface chemical state

JFE-TEC undertakes analysis of the surface state of materials by using various devices.

In surface analyses using Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), secondary ion mass spectrometry (SIMS), and glow discharge emission spectroscopy (GDS), it is possible to conduct qualitative analysis and quantitative analysis of a 1 nm material electrode surface.

In combination with ion sputtering, elementary analysis in depth direction is possible.

In X-ray photoelectron spectroscopy (XPS), analysis of chemical bonding state of elements is possible. Depending on the element, state analysis is possible even by AES or EPMA.

By Raman spectroscopy, FT-IR, NMR and mass analysis, structure analysis of organic matter is possible.

TEM-EDX/EELS

Available analysis method Feature Case example
  • In TEM-EDX and EELS, analysis of minute part in several nm level is possible.
  • In EELS, determination of chemical bonding state is possible.
  • By Cs corrector STEM, ultra-fine part X-ray spectroscopic analysis (DX) and electron energy loss spectroscopic analysis (EELS) at atomic scale are made possible.
  • By EPMA and SEM-EDX, analysis of minute part in μm level is possible.
  • By FE-EPMA, high-resolution (100 nm) qualitative analysis, quantitative analysis, and mapping are possible.
  • By ULV-SEM-EDX, qualitative analysis, quantitative analysis, and mapping at much higher resolution (30 nm) are possible.

Surface analysis

Available analysis method Feature Case example
  • Auger electron spectroscopy (AES)
  • Auger electron spectroscopy (AES)
  • X-ray photoelectron spectroscopy (XPS)
  • Secondary ion mass spectrometry (SIMS)
  • Time of flight-secondary - ion mass spectrometry (TOF-SIMS)
  • Glow discharge emission spectroscopy (GDS)
  • Radio-frequency glow discharge emission spectroscopy (rf-GDS)
  • Laser ablation ICP mass analysis (LA-ICP-MS)
  • AES
  • XPS
  • SIMS/TOF-SIMS
  • Measurement of depth-direction distribution of Li and F in electrode by rf-GDS
  • Depth-direction analysis of gold (Au) plating and nickel (Ni) plating for electric component
  • Element mapping of welded part using LA-ICP-MS
  • Distribution of Li in electrodes for Li-ion secondary batteries
  • Quantitative analysis of Pb-free solder/BGA
  • Analysis of impurities in striae parts in glass
  • Quantitative analysis of minute part for identification of old nail
  • Quantitative analysis of minute part of otolith for fish ecology investigation
  • X-ray photoelectron spectroscopy (XPS)
  • Secondary ion mass spectrometry (SIMS)
  • Time of flight-secondary ion mass spectrometry (TOF-SIMS)
  • Glow discharge emission spectroscopy (GDS)
  • High-frequency glow discharge emission spectroscopy (rf-GDS)

Analysis of molecular bonding state

Available analysis method Feature Case example
  • Fourier transform infrared absorption (FT-IR)
  • Chemical state analysis by means of chemical shift in molecular vibration is possible (Raman spectroscopy, FT-IR).
  • We undertake structure analysis of organic matter.
  • Minute part analysis of 1 μm in size is possible (Raman spectroscopy).
  • Depth-direction analysis is possible (confocal Raman spectroscopy).
FT-IR
  • Analysis of organic foreign substance attached on product
  • Investigation of polycarbonate resin deteriorated due to contact with metal
  • Analysis of product formed on electrode surface active material
  • Analysis of lubricant attached on metal
  • Investigation of deterioration of grease/lubricant
  • Analysis of product on electrode surface active material of lithium-ion secondary batteries
Raman spectroscopy
  • State analysis of carbon nanotube (CNT) using Raman spectroscopy
  • Evaluation of degree of graphitization of coal
  • Identification of oxide film on nickel (Ni)-based alloy surface
  • Identification of iron rust
  • Stress distribution in SiC epitaxial layer by confocal method
  • Raman spectroscopy (RS)

Chemical state analysis of bulk

By utilize various devices, we analyze the state of material in bulk.

Chemical state analysis of bulk average structure

Available analysis method Feature Case example
  • X-ray absorption fine structure (XAFS)
  • We conduct determination of molecular bond distance and coordination number (XAFS, EXAFS).
  • nalysis of chemical bonding state is possible (XAFS, XANES).
  • Conducts measurement of surface absorption element, thermal desorption atom/ molecule (TDS).
  • Structural analysis of organic matter is possible (NMR, thermal analysis, organic mass analysis).
XAFS
  • Measurement of fine particles of noble metal for vehicle combustion catalyst
  • Measurement of catalyst particle for fuel cell (FC)
NMR Thermal analysis/TDS Organic mass analysis
  • X-ray absorption near edge structure (XANES)
  • Extended X-ray absorption fine structure (EXAFS)
  • Thermal analysis (TG-DTS, TSC)
  • Thermal desorption spectroscopic analysis (TDS)

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